用途场景
研发
实验室研发、新产品开发、技术研究
生产
生产线检测、工艺控制、制造过程监控
品控
质量检验、来料检测、成品测试
合规认证
计量检测、仪器校准、精度验证
教学实训
教学实验、技能培训、实训演示
维修
设备维修、故障诊断、维护保养
规格型号价格
规格参数
产品特色
- FT and SLT compatible handler
- Ideal for device engineering characterization and analysis
- Compatible kit to scale-up production
- ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
- Auto tray loading/unloading and device sorting capability
- Air damper design ensures good contact balance
- Transfer shuttle remain IC check function
- Contact force 80/180kgf (Optional 450kgf)
- Optional dual force for bare die test
- Optional liquid submersion system
Applications
- Particularly suitable for
- AI chips
- Automotive semiconductors
- HPC related test
- Other advanced packaged semiconductors
产品介绍
Chroma Hybrid Single Site Test Handler 3110 is a full-range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with up to 450kg force load (option). Various temperature control units are available for selection to minimize response times and ensure test accuracy. Chroma 3110 is specifically designed for high-precision and high-power device characterization as well as other critical applications. The handler's exceptional design allows the robotics to operate accurately at extreme temperatures from -70℃ to 150℃ (option) and control its environmental conditions to within ±2℃.
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