用途场景
规格型号价格
| 型号 | 规格/配置 | 单位 | 价格 | 批发价 | 备注 |
|---|---|---|---|---|---|
| 3650 | SoC/Analog 测试系统 | — | 登录可见 | 登录可见 | 官网规格，价格面议 |
| VI45 | Analog Module Board (Option) | — | 登录可见 | 登录可见 | 官网规格，价格面议 |
| PVI100 | Analog Module Board (Option) | — | 登录可见 | 登录可见 | 官网规格，价格面议 |
| MPVI | Analog Module Board (Option) | — | 登录可见 | 登录可见 | 官网规格，价格面议 |
| HVVI | Analog Module Board (Option) | — | 登录可见 | 登录可见 | 官网规格，价格面议 |
| HDADDA | Mixed-signal Module Board (Option) | — | 登录可见 | 登录可见 | 官网规格，价格面议 |
规格参数
产品特色
- 50 / 100 MHz clock rate
100 / 200 Mbps (MUX) data rate - Up to 640 digital I/O pins (testhead 2)
- 32 M vector memory
- 32 M pattern instruction memory
- Per-pin PPMU / frequency measurement
- Scan features to 2G depth per scan chain
- ALPG option for memory test
- Up to 40 high-voltage I/O pins
- 8-32 16-bit ADDA channels option
- 32 high-performance DPS channels
- Edge placement accuracy ±300ps
- 32-CH HDADDA mixed-signal option
- 8-CH AWG and digitizer ASO mixed-signal audio band test option
- Max. 1000V (stacked) for HVVI analog option
- Max. 320A pulse mode (ganged) for MPVI analog option
- 32 CH per board for VI45 analog option
- 8 CH per board for PVI100 analog option
- Microsoft Windows® 7 / Windows® 10
- C++ and GUI programming interface
- CRISP, full suite of intuitive software tools
- Test program and pattern converters for other platforms
- Accept DIB and probe card of other testers by adding conversion kit
- Support STDF data output
- Air-cooled, small footprint
产品介绍
Semiconductor manufacturing is a fast-moving industry. While devices become increasingly integrated and multi-functional, capital equipment must be built to endure through several device generations and applications. With an array of available options such as AD-DA converter test, ALPG for memory test, high-voltage PE, multi-scan chain test, VI45, PVI100 & MPVI analog test, and ASO & HDADDA mixed-signal test, the Chroma 3650 provides wide coverage and flexible configurations for many device types.
The Chroma 3650 is an SoC test system with high throughput and high parallel test capabilities, providing the most cost-effective solution for fabless, IDM, and testing houses. With a complete range of test functions, high accuracy, powerful software tools, and excellent reliability, Chroma 3650 is the test solution for all your high-performance microcontroller, analog IC, consumer SoC device, and wafer sort applications.
High Performance in a Low-cost Production System
The Chroma 3650 brings down cost of test, not only by lowering the overall system's cost but also by delivering higher throughput and increased parallel test capability. Equipped with Chroma's advanced PINF IC and a sophisticated calibration system, the 3650 delivers exceptional timing accuracy within ±550ps. The pattern generator of the 3650 features up to 32M pattern instruction memory. This extensive memory depth matches the depth of the vector memory, allowing for pattern instructions to be added for each test vector.
The system's powerful sequential pattern generator provides a variety of pattern commands to meet the demands of complex test vectors. The true test-per-pin architecture and flexible site mapping with no slot boundaries are designed for multi-site test with high throughput. With up to 640 digital pins, 32 device power supplies, per-pin PMU and analog test capability, the 3650 delivers a combination of excellent test performance and throughput in a cost-effective test solution.
High Parallel Test Capability
The 3650's powerful and versatile parallel pin electronics excel at simultaneously executing identical parametric tests on multiple pins. Each LPC board houses 64 digital pins driven by 16 high-performance Chroma PINF ICs, each supporting 4 timing generator channels. Integrated local controller circuitry streamlines resource management and result readout, minimizing the overhead of the system controller. With its flexible any-pin-to-any-site mapping design, the 3650 enables high-throughput parallel testing on up to 32 sites, optimizing mass production efficiency and simplifying layout.
▲ 64-Channel Digital Pin Card
Flexibility
The semiconductor industry is a fast moving one, and capital equipment must be built to outlive several device generations and applications. With a broad range of available options, such as AD-DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, and VI45 & PVI100 & MPVI analog options, Chroma 3650 makes sure that it will serve you for years to come.
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